JEOL JSM 7001F Schottky Emission SEM

Microscope Specifications

• Age: 2011
• Resolution: 1.2 nm at 30 kV, 3.0 nm at 1.0 kV
• Accelerating Voltage: 0.5 to 30 kV
• Specimen Stage: Mechanically eucentric at all WDs
• Imaging modes: SE, BEI to E/T detector
• OS: Windows 10
• External Detectors: None
• Price: Available on request