Philips XL30 Tungsten Filament SEM with Point Electronics Upgrade

Microscope specifications:

• Age: Circa 1994
• Resolution: 3.5 nm at 30 kV
• Accelerating Voltage: 0.5 to 30 kV
• Specimen Stage: 4-axis motorised eucentric at all WDs
• Imaging Modes: SE
• OS: Windows 10
• External Detectors: None
• Price: Available on request